ADC Buffer test pattern configuration Parameters.
The structure is used to define ADC Buffer test pattern configuration.
Data Fields | |
| ADCBuf_rxTestPatternConf | rxConfig [SOC_ADCBUF_NUM_RX_CHANNEL] |
| Test pattern configuration for Rx channels. More... | |
| uint16_t | period |
| Periodicity of the pattern. More... | |
| uint16_t | numSamples |
| Sample count to store in ADC buffer. More... | |
| ADCBuf_rxTestPatternConf ADCBuf_TestPatternConf::rxConfig[SOC_ADCBUF_NUM_RX_CHANNEL] |
Test pattern configuration for Rx channels.
| uint16_t ADCBuf_TestPatternConf::period |
Periodicity of the pattern.
| uint16_t ADCBuf_TestPatternConf::numSamples |
Sample count to store in ADC buffer.