xWRL684x MMWAVE-L-SDK  06.00.05

Detailed Description

ADC Buffer test pattern configuration Parameters.

The structure is used to define ADC Buffer test pattern configuration.

Data Fields

ADCBuf_rxTestPatternConf rxConfig [SOC_ADCBUF_NUM_RX_CHANNEL]
 Test pattern configuration for Rx channels. More...
 
uint16_t period
 Periodicity of the pattern. More...
 
uint16_t numSamples
 Sample count to store in ADC buffer. More...
 

Field Documentation

◆ rxConfig

ADCBuf_rxTestPatternConf ADCBuf_TestPatternConf::rxConfig[SOC_ADCBUF_NUM_RX_CHANNEL]

Test pattern configuration for Rx channels.

◆ period

uint16_t ADCBuf_TestPatternConf::period

Periodicity of the pattern.

◆ numSamples

uint16_t ADCBuf_TestPatternConf::numSamples

Sample count to store in ADC buffer.